The ResiScope II is a unique system able to measure AFM resistance over 10 decades with a high sensitivity and resolution. It can be combined with several dynamic modes as MFM/EFM (AC/MAC mode) or KFM single‐pass (AC/MAC III) providing several sample characterization on the same scan area.

Applications :

• Photovoltaic          
• Semiconductors     
• Oxyde characterization
• All conductive characterization

Intuitive software

1.   Easy to use
2.   Automatic mode selection
3.   Configurable outputs
4.   Selectable output scale : R | Log R | Current

Principle :
During the measurement, the DSP chooses in real time the best gain to optimize the measurement made by the amplifier module (HPA). This operating condition allows a very high sensitivity on all the range of resistivity at a regular scan speed (AFM) . Contrary to other techniques, the current between the probe and the sample is strongly reduced. This has the result of limiting the local effect of oxidation or electrochemistry and protecting the conductive probe from high current damage.

ResiScope is a smart real-time control of the appropriate ranges to obtain the best measurement (sensitivity and range). It limits the current through tip and sample is limited to prevent any damage. It is more than a simple linear or Log amplifier used for a basic current measurement