Features:
1. Adopt white light confocal chromatic aberration technology to obtain nano-level resolution
2. Non-contact measurement, without damaging the sample
3. Fast measurement speed and high accuracy
4. The measurement is simple and the sample does not require special treatment
Brand: Nanovia
Model: PS50, ST400, ST500, JR25
Product
White light confocal microscope
Overview
NANOVEA company launched a variety of research-oriented three-dimensional surface topography measurement equipment,
using the international leading white light confocal technology, can achieve the surface volume of the material from nanometer to millimeter scale test, with high measurement accuracy and fast speed.
The instrument is cost-effective and can be used to replace traditional probe-type surface topography and interferometric surface topography.
Features:
1. Adopt white light confocal chromatic aberration technology to obtain nano-level resolution
2. Non-contact measurement, without damaging the sample
3. Fast measurement speed and high accuracy
4. Wide measuring range: transparent, metallic materials, translucent, high diffuse reflection, low reflectivity, polishing, rough materials (metal, glass, wood, synthetic materials, optical materials, plastics, paints, paints, lacquers, paper, skin , Hair, teeth...);
5. Especially suitable for measuring the surface of materials with high slope and high tortuosity
6. Not affected by ambient light
7. Simple measurement, no special treatment for samples
8. Large measuring range in Z direction: 27mm
2D & 3D SURFACE MEASUREMENT
Roughness 
Texture
Geometry
Step height & Thickness
Technical Specifications
