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Liquid measurement AFM
Liquid measurement AFM
Main feature:
1. Quickly and accurately obtain nano-surface features-high-resolution images can be obtained within five minutes
2. Intuitive operation and quick start---less than 5 minutes from starting to scanning
3. The highest price-performance ratio---the price of other brands on the market is less than 1/2
4. Vertical optical path design, with gas-liquid dual-purpose probe holder can be used in air or liquid at the same time
5. High magnification optical positioning system to achieve precise positioning of probe and sample scanning area

Purpose:
Provide solid and liquid three-dimensional surface morphology images, including surface roughness, particle size, height difference and spacing

Brand: FSM
Model: OP-AFM
Overview

Features:
1. It has both optical and atomic force microscope imaging functions, and can simultaneously scan and image without affecting each other;
2. It has both optical two-dimensional measurement and atomic force microscope three-dimensional measurement functions;
3. The vertical optical path design is adopted, and the gas-liquid dual-purpose probe holder can be used in air or liquid at the same time;
4. Using high-power optical positioning system to achieve precise positioning of probe and sample scanning area;
5. Simple laser calibration, real-time observation and adjustment of laser light class through optical CCD window;
6. The single-axis driving sample automatically approaches the probe vertically, accurately positioning the scanning area, so that the needle tip is perpendicular to the sample scanning;
7. The motor controls the intelligent needle feeding method for the automatic detection of pressurized electric ceramics to protect the probe and samples;
8. Need to be equipped with air-floating anti-vibration platform (optional), strong anti-interference ability, does not affect the operation of the instrument;
9. Integrated scanner hardware non-linear correction user editor, nano-feature performance and measurement accuracy up to 98%.

Technical Specifications

◆Atomic force working mode: contact, tap, F-Z force curve measurement, RMS-Z curve measurement, friction force/lateral force, amplitude/phase difference, magnetic force and electrostatic force, optional liquid mode
◆Atomic force scanning range: XY direction 20um, Z direction 2um (optional XY direction 50um, Z direction 5um)
◆Sample size: Φ≤90mm, H≤20mm
◆Scanning resolution: XY 0.2nm, Z 0.05mm
◆Sample movement range: 0~20mm
◆Optical objective lens: 5X, 10X, 20X, 50X plan apochromat
◆Optical eyepiece: 10X
◆CCD sensor: 3 million pixels
◆Display: 11.6-inch flat panel display with measurement function
◆Optical focusing method: electric focusing
◆Scanning speed 0.6Hz~4.34Hz, scanning angle 0~360°
◆Scanning control: XY adopts 18-bit D/A, Z adopts 16-bit D/A
◆Data sampling: 14-bit A/D, dual 16-bit A/D
◆Feedback mode: DSP digital feedback
◆Feedback sampling rate: 64.0KHz
◆Communication interface: USB2.0/3.0
◆Operating environment: WindowsXP/7/8/10 operating system

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