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產品介紹
前處理製程設備
高壓均質機(連續式)
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入門型鍍金機
全自動濺鍍機
磁控濺鍍機
熱蒸發鍍碳機
高真空磁控濺鍍機
奈米表面量測
掌上型/入門AFM
高性價比/桌上型AFM
液態量測AFM
全功能/研究型AFM
教學/入門型STM
工業型自動化AFM
白光干涉儀+共軛焦顯微鏡(入門款)
白光共聚焦顯微鏡
法國 CSI AFM
Nano-Observer AFM
Galaxy Dual Controller
ResiScope模組
KPFM(HD-KFM)表面電位檢測
sMIM (Scanning Microwave Impedance Microscopy)
表面特性分析
軟物質奈米壓痕儀
防震台
主動式除震台
被動式防震台
壓電制動平台
壓電位移平台
各式AFM探針
Olympus
Mikromasch
AppNano
TipsNano
技術應用
原子力顯微鏡(AFM)
行星式脫泡攪拌機
主動式除震台
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Mikromasch
產品介紹
Mikromasch
產品特點:
1. 世界大廠,品質優良
2. 價格實惠,性價比高
3. 適合初階或練習量測使用
品牌: Mikromasch
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概觀
Resolution
HIGH RESOLUTION
Lateral resolution below 1 nm. For scanning small areas below 250 nm at 512 points.
1 nm radius tip
Hi'Res-C
GENERAL PURPOSE
Lateral resolution down to
5 nm for scan size below 1 μm.
8 nm radius trihedral silicon tip
HQ:NSC, CSC & XSC
LONG SCANNING
Accurate resolution of surface features larger than 10 nm in diameter. Good for scan sizes above 2 μm at 512 points.
20 nm radius hard DLC coated tips
HARD
100 - 250 nm radius conductive diamond coated tip
DMD
Special Applications
TIPLESS
Tipless cantilevers for various custom applications such as attaching spheres.
Three tipless cantilevers per chip
Tipless
CONDUCTIVE
Probes with special coatings for conductive AFM modes.
40 nm radius tip
DPE (low-noise)
20 nm radius tip
DPER (high-resolution)
30 nm radius tip
Pt coated
35 nm radius tip
Cr-Au coated
MAGNETIC
Probes with magnetic coating for MFM.
60 nm radius magnetic tip
Co-Cr coated
SILICON NITRIDE
Probes with silicon nitride cantilevers and tips.
10-30 nm radius pyramidal tip
XNC12
Cantilevers
1-lever
15 series
325 kHz (40 N/m)
16 series
190 kHz (45 N/m)
14 series
160 kHz (5 N/m)
19 series
65 kHz (0.5 N/m)
18 series
75 kHz (2.8 N/m)
17 series
13 kHz (0.18 N/m)
3-lever
35 series
150 - 300 kHz
(5.4 - 16 N/m)
36 series
65 - 130 kHz
(0.6 - 2 N/m)
37 series
20 - 40 kHz
(0.3 - 0.8 N/m)
38 series
10 - 20 kHz
(0.03 - 0.09 N/m)
4-lever
11 series
15 - 350 kHz
(0.2 - 42 N/m)
12 series
17 - 67 kHz
(0.08 - 0.32 N/m)
Contact Mode
Tapping Mode
High Resolution
Long Scanning
Electric
Magnetic
技術規格
技術應用
How To Choose By
AFM TECHNIQUE
Tapping Mode
Contact Mode
Noncontact Mode
Lift Mode
TYPE OF SAMPLE
Robust
Soft or Fragile
AFM EXPERIMENT
Topography
Composition
Mechanical
Electric
Magnetic
RESOLUTION
High Resolution
General Purpose
Long Scanning
Applications
LIFE SCIENCE
Bacteria Cell
Potato-X Virus
Fibrin Strand
DNA
CHEMISTRY
Molecular Wires
Latex
POLYMERS
Single Molecules
Molecular Brushes
Polyethylene Crystal
Liquid Crystalline
METROLOGY
Roughness of Si Wafer
Critical Dimension
HETEROGENEOUS SYSTEMS
Impact Modified Plastics
Technical Rubber
PS-b-PMMA Copolymer
SURFACE SCIENCE
Nanolithography on Ti
Langmuir Monolayer
Self-Assemblies
MATERIALS RESEARCH
Au (111)
BaTiO3 Piezoceramics
Alkanes
DATA STORAGE
Hard Disk
3.5'' Zip Disk
Optical Disk
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