產品介紹

樸實的外表，

不凡的內在。

每一次的量測都值得信賴，

每一次的操作都感覺自在 。

匠心獨具的NX7，

來自韓國大廠 Park Systems ，

具備了所有高階AFM該有的功能及效能，

然而您可用相對實惠的價格擁有它。

The most affordable research grade AFM with flexible sample handling

Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.

The Most Extensible AFM Solution

Supports Park’s most extensive range of SPM modes and options in the industry

Accurate XY Scan by Crosstalk Elimination

• Two independent, closed-loop XY and Z flexure scanners
• Flat and orthogonal XY scan with low residual bow
• Accurate height measurements without any need for software processing

The Most Extensible AFM Solution

• The most comprehensive range of SPM modes
• Advanced nanomechanical measurement modes are supported as default enabled by NX electronic controller
• The best option compatibility and upgradeability in the industry

User Experience-Driven Software and Hardware Features

• Open side access for easy sample or tip exchange
• Easy, intuitive laser alignment with pre-aligned tip mount
• Park SmartScanTM - AFM operating software versatile enough to empower both novices and power users alike toward great nanoscale research

Park's Crosstalk Elimination scanner structure removes scanner bow,

allowing flat orthogonal XY scanning regardless of scan location, scan rate, and scan size.

It shows no background curvature even on flattest samples, such as an optical flat, and with various scan offsets.

This provides you with a very accurate height measurement and precision nanometrology

for the most challenging problems in research and engineering.

Park AFMs are equipped with the most effective low noise Z detectors in the field,

with a noise of 0.02 nm over large bandwidth. This produces highly accurate sample topography and no edge overshoot.

Just one of the many ways Park NX series saves you time and gives you better data.

True Non-Contact™ Mode is a scan mode unique to Park AFM systems that produces high resolution

and accurate data by preventing destructive tip-sample interaction during a scan.

Unlike in contact mode, where the tip contacts the sample continuously during a scan, or in tapping mode,

where the tip touches the sample periodically, a tip used in non-contact mode does not touch the sample.

Because of this, use of non-contact mode has several key advantages.

Scanning at the highest resolution throughout imaging is now possible as the tip’s sharpness is maintained.

Non-contact mode avoids damaging soft samples as the tip and sample surface avoid direct contact.

Furthermore, non-contact mode senses tip-sample interactions occurring all around the tip.

Forces occurring laterally to tip approach to the sample are detected.

Therefore, tips used in non-contact mode can avoid crashing into tall structures that may suddenly appear on a sample surface.

Contact and tapping modes only detect the force coming from below the tip and are vulnerable to such crashes.

Park NX7 Specifications